DocumentCode
3089543
Title
Noise constrained power optimization for dual VT domino logic
Author
Jung, Seong-Ook ; Kim, Ki-Wook ; Kang, Sung-Mo Steve
Author_Institution
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Volume
4
fYear
2001
fDate
6-9 May 2001
Firstpage
158
Abstract
In dual threshold voltage techniques, significant subthreshold leakage current is one of the most important design problems. When dual threshold voltage is applied to the domino logic, noise immunity has to be carefully considered because the significant subthreshold current makes dynamic nodes much more susceptible to noise. In this paper, an analytical model for proper keeper transistor sizing to meet noise constraint is presented. Based on the same noise constraint, we propose dual threshold voltage domino logic technique to save power consumption
Keywords
CMOS logic circuits; circuit optimisation; integrated circuit modelling; integrated circuit noise; leakage currents; low-power electronics; analytical model; dual VT domino logic; dual threshold voltage techniques; keeper transistor sizing; noise constrained power optimization; noise constraint; noise immunity; power consumption; subthreshold leakage current; CMOS logic circuits; Clocks; Constraint optimization; Crosstalk; Dynamic voltage scaling; Logic gates; MOSFETs; Noise figure; Pulse inverters; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2001. ISCAS 2001. The 2001 IEEE International Symposium on
Conference_Location
Sydney, NSW
Print_ISBN
0-7803-6685-9
Type
conf
DOI
10.1109/ISCAS.2001.922196
Filename
922196
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