DocumentCode :
3089610
Title :
Comprehensive methodology for the design and assessment of crossbar memory array with nonlinear and asymmetric selector devices
Author :
An Chen
Author_Institution :
TD Res., GLOBALFOUNDRIES, Sunnyvale, CA, USA
fYear :
2013
fDate :
9-11 Dec. 2013
Abstract :
Technology and design tradeoffs are important for crossbar memory array optimization. A comprehensive model is presented in this paper to assess array functionality with different nonlinear and asymmetric selector parameters, bias schemes, and array designs. Array Vdd should be maximized within power and efficiency constraints. Partial bias schemes can be chosen based on selector types and design targets. Different dependence of array selectivity and power efficiency on selector parameters presents technology tradeoffs. Impact of line resistance, contact resistance, and memory variability is analyzed. Parallel access and self-selecting design may improve array performance.
Keywords :
random-access storage; semiconductor device models; array designs; array functionality; array selectivity; asymmetric selector parameters; contact resistance; crossbar memory array optimization; design targets; line resistance; memory variability; nonlinear selector parameters; parallel access; partial bias schemes; power efficiency; selector types; self-selecting design; Arrays; Junctions; Power demand; Resistance; Sensors; Switches; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2013 IEEE International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEDM.2013.6724723
Filename :
6724723
Link To Document :
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