DocumentCode :
3089630
Title :
Calibration of AFM based nanomanipulation system
Author :
Li, Guangyong ; Xi, Ning ; Yu, Mengrneng
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
1
fYear :
2004
fDate :
26 April-1 May 2004
Firstpage :
422
Abstract :
Using AFM as a nanomanipulation tool has been discussed for more than a decade. However, its lack of real-time visual feedback during manipulation has hindered its wide application. Fortunately, this problem has been overcome by our recently developed augmented reality system. Not only can this new system provide real-time force feedback but real-time visual feedback during nanomanipulation. In order to build this augmented reality system, a lot of parameters are used to model the force interaction, measure the forces, and control the tip motion. In this paper, calibration of all parameters used in the augmented reality system is discussed in details.
Keywords :
atomic force microscopy; augmented reality; calibration; force feedback; micromanipulators; nanotechnology; real-time systems; atomic force microscopy; augmented reality system; nanomanipulation system calibration; real-time force feedback; real-time visual feedback; Atomic force microscopy; Augmented reality; Calibration; Displays; Force feedback; Force measurement; Haptic interfaces; Motion measurement; Optical microscopy; Real time systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Robotics and Automation, 2004. Proceedings. ICRA '04. 2004 IEEE International Conference on
ISSN :
1050-4729
Print_ISBN :
0-7803-8232-3
Type :
conf
DOI :
10.1109/ROBOT.2004.1307186
Filename :
1307186
Link To Document :
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