Title :
Calibration of AFM based nanomanipulation system
Author :
Li, Guangyong ; Xi, Ning ; Yu, Mengrneng
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fDate :
26 April-1 May 2004
Abstract :
Using AFM as a nanomanipulation tool has been discussed for more than a decade. However, its lack of real-time visual feedback during manipulation has hindered its wide application. Fortunately, this problem has been overcome by our recently developed augmented reality system. Not only can this new system provide real-time force feedback but real-time visual feedback during nanomanipulation. In order to build this augmented reality system, a lot of parameters are used to model the force interaction, measure the forces, and control the tip motion. In this paper, calibration of all parameters used in the augmented reality system is discussed in details.
Keywords :
atomic force microscopy; augmented reality; calibration; force feedback; micromanipulators; nanotechnology; real-time systems; atomic force microscopy; augmented reality system; nanomanipulation system calibration; real-time force feedback; real-time visual feedback; Atomic force microscopy; Augmented reality; Calibration; Displays; Force feedback; Force measurement; Haptic interfaces; Motion measurement; Optical microscopy; Real time systems;
Conference_Titel :
Robotics and Automation, 2004. Proceedings. ICRA '04. 2004 IEEE International Conference on
Print_ISBN :
0-7803-8232-3
DOI :
10.1109/ROBOT.2004.1307186