Title :
Current testable design of resistor string DACs
Author :
Hashizume, Masaki ; Nishida, Tomomi ; Yotsuyanagi, Hiroyuki ; Tamesada, Takeomi ; Miura, Yukiya
Author_Institution :
Fac. of Eng., Tokushima Univ., Japan
Abstract :
In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string digital/analog converter (DAC). The results show that all of the shorts and the opens are detected by supply current testing, while opens of the MOS switches are not detected. A DFT method for resistor string DACs is proposed in this paper to detect the opens by supply current testing. Also, testability of a resistor string DAC designed with the DFT method is examined. It is shown that all of the targeted shorts and opens in the testable designed DAC are detected by supply current testing.
Keywords :
circuit testing; digital-analogue conversion; network synthesis; power supply circuits; 3 bit; DFT method; MOS switches; current testable design; digital-analog converter; resistor string DAC; supply current testing; CMOS logic circuits; Current supplies; Design engineering; Design for testability; Integrated circuit testing; Logic testing; Resistors; Switches; Systems engineering and theory; Voltage;
Conference_Titel :
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Print_ISBN :
0-7695-2500-8
DOI :
10.1109/DELTA.2006.28
