Title :
Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications
Author :
Kerkhoff, Hans G. ; Huijts, Jarkko J M
Author_Institution :
Centre of Telecommun. & Inf. Technol. (CTIT), Enschede
Abstract :
The advances of CMOS technology towards 45 nm, the high costs of ASIC design, power limitations and fast changing application requirements have stimulated the usage of highly reconfigurable multi-processor-cores SoCs. These processing cores within the SoC can be subsequently connected with each other by a communication-centric NoC, thereby reducing data-traffic problems. The (repetitive) multi-processor-cores feature inside these SoCs, the programmable routing via NoC, as well as the repetitive hardware in the cores themselves provides new opportunities for efficient testing at different hierarchical levels. These opportunities, and the inserted DfT, test vectors and coverage can be subsequently applied for enhancing the dependability of SoCs as well as these cores via self-repair. As examples of new opportunities we introduce the feedback loop and KGC concept for enhancing diagnosis and reducing external communication respectively. The self-repair can be done either by rerouting of unused resources or software remapping of correct resources to an application.
Keywords :
CMOS integrated circuits; data communication; design for testability; integrated circuit testing; logic testing; network routing; network-on-chip; system-on-chip; ASIC design; CMOS technology; DfT; KGC concept; SoC; communication-centric NoC; data streaming applications; data-traffic problems; feedback loop; highly reconfigurable processor core; multiprocessor-cores; programmable routing; software remapping; Application software; Automatic testing; CMOS technology; Electronic equipment testing; Hardware; Information technology; Network-on-a-chip; Routing; System testing; Tiles; ATPG; Design-for-Test; dependable SoCs; embedded system test; reconfigurable multi-processor-cores SoC; self-repair;
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
DOI :
10.1109/DELTA.2008.34