DocumentCode :
3089760
Title :
Can trace-driven simulators accurately predict superscalar performance?
Author :
Black, Bryan ; Huang, Andrew S. ; Lipasti, Mikko H. ; Shen, John Paul
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
1996
fDate :
7-9 Oct 1996
Firstpage :
478
Lastpage :
485
Abstract :
There are four crucial issues associated with performance simulators: simulator retargetability, simulator validation, simulation speed and simulation accuracy. The paper documents our experiences in developing performance simulators and our recent findings in using these simulators. We are concerned with all four of the crucial issues. Our first generation tool, VMW, focused on achieving retargetability. Our second generation tool, MW, significantly improved simulation speed. Recently we validated a PowerPC 604 simulator model, generated using MW against an actual PowerPC 604 hardware system. We also present results on simulating extremely long traces on our PowerPC 620 model and highlight potential inaccuracies that can result from trace sampling. As processor complexity continues to increase at a rapid rate and microarchitectures continue to become more speculative, it is not clear whether the trace driven paradigm of performance simulation can continue to effectively predict actual machine performance
Keywords :
parallel architectures; parallel machines; performance evaluation; virtual machines; MW; PowerPC 604 hardware system; PowerPC 604 simulator model; VMW; extremely long traces; first generation tool; machine performance; microarchitectures; performance simulation; performance simulators; processor complexity; retargetability; second generation tool; simulation accuracy; simulation speed; simulator retargetability; simulator validation; superscalar performance prediction; trace driven paradigm; trace driven simulators; trace sampling; Computational modeling; Computer simulation; Hardware; Microarchitecture; Power generation; Power system modeling; Predictive models; Sampling methods; Timing; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1996. ICCD '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-8186-7554-3
Type :
conf
DOI :
10.1109/ICCD.1996.563596
Filename :
563596
Link To Document :
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