Title :
Quartz crystal resonator model measurement and sensitivity analysis
Author :
Park, Karen ; Malocha, Donald ; Belkerdid, Madjid
Author_Institution :
Dept. of Electr. Eng. & Commun. Sci., Univ. of Central Florida, Orlando, FL, USA
fDate :
31 May-2 Jun 1989
Abstract :
A quartz crystal resonator that can be modeled as a one- or two-port electrical circuit is discussed. Extraction of the equivalent electrical parameters can be accomplished using scattering parameters measured near the resonant frequency of the crystal. Due to measurement errors inherent in the network analyzer, the extracted parameters will vary from run to run. These measurement inaccuracies lead to greater errors in the electrical parameters as the magnitude of S11 (one-port model) or S12 (two-port model) approaches one. This work presents results of measured and simulated data and a first-order sensitivity theory. An expression for the error in the extracted series resistance is derived. Simulated and actual crystal data are compared to the theoretical values for the one-port model
Keywords :
S-parameters; crystal resonators; equivalent circuits; network analysers; quartz; sensitivity analysis; crystal resonator model; equivalent electrical parameters; measurement errors; network analyzer; one-port model; quartz; resonant frequency; scattering parameters; sensitivity analysis; series resistance; two-port electrical circuit; Circuits; Data mining; Electric resistance; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Measurement errors; Resonant frequency; Scattering parameters; Sensitivity analysis;
Conference_Titel :
Frequency Control, 1989., Proceedings of the 43rd Annual Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/FREQ.1989.68892