Title :
Innovation in test: where are we
Author :
Rajsuman, Rochit
Author_Institution :
Advantest America Corp., Santa Clara, CA, USA
Abstract :
In this paper, key recent innovations with respect to all major segments of the test industry are discussed. These innovations do not provide incremental improvement; they change the paradigm impacting the productivity and cost by orders of magnitude. The objective is to provide guidance for academic and industrial researchers for these new grounds.
Keywords :
integrated circuit testing; integrated circuit testing; logic testing; test industry; Automatic testing; Computer architecture; Costs; Hardware; Instruments; Productivity; Semiconductor device testing; Software testing; Switches; Technological innovation;
Conference_Titel :
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Print_ISBN :
0-7695-2500-8
DOI :
10.1109/DELTA.2006.59
