DocumentCode
3089959
Title
Innovation in test: where are we
Author
Rajsuman, Rochit
Author_Institution
Advantest America Corp., Santa Clara, CA, USA
fYear
2006
fDate
17-19 Jan. 2006
Abstract
In this paper, key recent innovations with respect to all major segments of the test industry are discussed. These innovations do not provide incremental improvement; they change the paradigm impacting the productivity and cost by orders of magnitude. The objective is to provide guidance for academic and industrial researchers for these new grounds.
Keywords
integrated circuit testing; integrated circuit testing; logic testing; test industry; Automatic testing; Computer architecture; Costs; Hardware; Instruments; Productivity; Semiconductor device testing; Software testing; Switches; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2006. DELTA 2006. Third IEEE International Workshop on
Print_ISBN
0-7695-2500-8
Type
conf
DOI
10.1109/DELTA.2006.59
Filename
1581227
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