• DocumentCode
    3090220
  • Title

    Amplitudes of transverse waves in the acoustical birefringence in [110] Silicon single crystal

  • Author

    Hye-Jeong Kim ; Seho Kwon ; Kim, You Ho

  • Author_Institution
    Appl. Acoust. Lab., Korea Sci. Acad. of KAIST, Busan, South Korea
  • fYear
    2013
  • fDate
    21-25 July 2013
  • Firstpage
    1634
  • Lastpage
    1637
  • Abstract
    Wave velocities are dependent on the propagation direction in an anisotropic solid, and transverse waves can propagate with different wave velocities for certain propagation direction. The particle displacements are determined by propagating transverse wave mode. In the present work, the waves velocities and amplitudes of transverse waves were investigated when transverse wave with arbitrary direction of particle displacement propagate in anisotropic solids. Acoustic birefringence of bulk transverse wave propagating in [110] direction through silicon single crystal is studied. There are two transverse wave modes when the wave is applied along [110] direction in single crystal. Transverse wave is generated by using 20 MHz frequency transducer which delay line is 7 μs. For delicate control of vibration axis position, the [110] silicon single crystal is attached to rotary table with angle indicator. By pulse/echo method, the same transducer detects elastic transverse wave which is reflected and turns back from the opposite boundary of the sample.
  • Keywords
    acoustic wave propagation; birefringence; elastic constants; elastic waves; elemental semiconductors; silicon; ultrasonic propagation; vibrations; Si; [110] silicon single crystal; acoustic birefringence; angle indicator; anisotropic solids; bulk transverse wave propagation; elastic constants; elastic transverse wave; frequency 20 MHz; frequency transducer; particle displacement; pulse-echo method; rotary table; transverse wave amplitude; ultrasonic wave propagation; vibration control axis position; wave velocity; Acoustics; Crystals; Equations; Optical polarization; Silicon; Solids; Time-domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2013 IEEE International
  • Conference_Location
    Prague
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-5684-8
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2013.0416
  • Filename
    6724753