DocumentCode
3090258
Title
New Secure Bilateral Transaction Matrix Using AC Distribution Factors with Slack bus contribution and Impact of TCPAR on Its Pattern
Author
Kumar, Ashwani ; Chanana, S.
Author_Institution
Dept. of Electr. Eng., Nat. Inst. of Technol., Kurukshetra
fYear
2007
fDate
24-28 June 2007
Firstpage
1
Lastpage
8
Abstract
In the competitive electricity environment, a large number of transactions are expected to be negotiated, which can compromise the system security and reliability. Therefore, it has become essential to determine secure transactions occurring in the new environment for better planning and management of open access environment. This paper proposes a new method of secure bilateral transaction determination using AC distribution factors with slack bus contribution. The bilateral transaction matrix pattern has been determined in the presence of thyristor controlled phase angle regulator (TCPAR). The optimal location of TCPAR has been determined using mixed integer non-linear programming approach. The bilateral transaction matrix has been determined in a hybrid market model. The proposed technique has been applied on IEEE 24-bus reliability test system (RTS).
Keywords
integer programming; matrix algebra; nonlinear programming; power markets; power system management; power system planning; power system reliability; power system security; thyristor applications; AC distribution factors; TCPAR; hybrid market model; mixed integer nonlinear programming; open access environment planning; secure bilateral transaction matrix; slack bus contribution; system management; system reliability; thyristor controlled phase angle regulator; Companies; Contracts; Costs; Energy management; Environmental economics; Load flow; Power generation; Power generation economics; Power system reliability; Power system security; Secure transaction matrix; TCPAR location; distribution factor; mixed integer non-linear programming; transaction matrix pattern;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society General Meeting, 2007. IEEE
Conference_Location
Tampa, FL
ISSN
1932-5517
Print_ISBN
1-4244-1296-X
Electronic_ISBN
1932-5517
Type
conf
DOI
10.1109/PES.2007.385640
Filename
4275249
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