DocumentCode :
3090502
Title :
A Jittered-Sampling Correction Technique for ADCs
Author :
Tourabaly, Jamiil ; Osseiran, Adam
Author_Institution :
Edith Cowan Univ., Perth
fYear :
2008
fDate :
23-25 Jan. 2008
Firstpage :
249
Lastpage :
252
Abstract :
Jittered sampling raises the noise floor in Analogue to Digital Converters (ADCs). This leads to a decrease in its Signal to Noise ratio (SNR) and its effective number of bits (ENOB). This extended abstract proposes a technique that compensate for the effects of sampling with a jittered clock. A novel technique based on phase demodulation of the clock oscillator and Taylor series approximation is proposed to counter the effects of clock jitter in ADCs. Since jitter is caused by phase noise, phase demodulation provides a good estimate of the instantaneous jitter. A VLSI implementation of Taylor series is used to predict the input signal value at the correct time instant.
Keywords :
analogue-digital conversion; demodulation; jitter; sampling methods; ADC; ENOB; SNR; Taylor series approximation; VLSI implementation; analogue-to-digital converters; clock oscillator; effective number-of-bits; jittered-sampling correction technique; phase demodulation; signal-to-noise ratio; Analog-digital conversion; Clocks; Counting circuits; Demodulation; Jitter; Oscillators; Phase noise; Sampling methods; Signal to noise ratio; Taylor series; ADC; Jitter correction; data converters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location :
Hong Kong
Print_ISBN :
978-0-7695-3110-6
Type :
conf
DOI :
10.1109/DELTA.2008.79
Filename :
4459550
Link To Document :
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