DocumentCode :
3090653
Title :
Generation Asset Valuation Under Market Uncertainties
Author :
Sun, Erjiang ; Liu, Edwin
Author_Institution :
Nexant Inc., San Francisco, CA
fYear :
2007
fDate :
24-28 June 2007
Firstpage :
1
Lastpage :
6
Abstract :
Energy industry deregulation has made generation asset valuation a significant challenge. Billions of dollars have been invested in the acquisition of power generation assets. In order to manage financial risks, market participants require both detailed market structure analyses and efficient valuation methodologies as part of their due diligence processes. This paper introduces the concept of using price-based unit commitment for generation asset valuation, within the framework of Monte Carlo simulations. The method can capture the uncertainties of energy markets as well as complex generation operation characteristics. Functionality requirements of effective software tools for asset valuation are also discussed. Applying the fundamentals of stochastic simulation and generation unit commitment to asset valuation is an essential part of overall portfolio management for energy market participants.
Keywords :
Monte Carlo methods; power engineering computing; power generation dispatch; power generation economics; power generation scheduling; power markets; power system management; pricing; risk management; stochastic processes; Monte Carlo simulations; complex generation operation characteristics; due diligence process; energy industry deregulation; financial risk management; generation asset valuation; power market uncertainties; price-based unit commitment; software tools; stochastic simulation; Character generation; Cost accounting; Energy capture; Financial management; Power generation; Risk analysis; Risk management; Software tools; Stochastic processes; Uncertainty; Monte Carlo simulation; asset valuation; deregulation; energy market; price-based unit commitment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society General Meeting, 2007. IEEE
Conference_Location :
Tampa, FL
ISSN :
1932-5517
Print_ISBN :
1-4244-1296-X
Electronic_ISBN :
1932-5517
Type :
conf
DOI :
10.1109/PES.2007.385662
Filename :
4275271
Link To Document :
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