Title :
Self-checking and fault tolerance quality assessment using fault sampling
Author :
Gonçalves, F.M. ; Santos, M.B. ; Teixeira, I.C. ; Teixeira, J.P.
Author_Institution :
IST/INESC-ID, Lisboa, Portugal
Abstract :
The computational effort associated with fault simulation (FS) processes in digital systems can become overwhelming, due to circuit complexity, test pattern size or fault list size. The same applies when safety properties (such as fault tolerance or fail-safe) need to be verified in a new product development, in the design environment. If a bridging fault model replaces the simple stuck-at fault model, the fault list size easily becomes very large. If the product needs to comply to safety standards, such as EN298, these properties need to be verified in the presence of double faults, which explodes the fault list dimension. In this paper, a novel method is proposed to deal with this problem, based on fault sampling. A model to compute the confidence level that the global fault coverage, FC, is within the interval [FCmin 100%] is proposed. A case study, an ASIC for a safety-critical gas burner control system, is used to ascertain the usefulness of the proposed methodology.
Keywords :
application specific integrated circuits; automatic test pattern generation; combustion; digital systems; fault simulation; fault tolerance; product development; ASIC; EN298; bridging fault model; circuit complexity; confidence level; digital systems; double faults; fault list dimension; fault list size; fault sampling; fault simulation; fault tolerance; global fault coverage; product development; quality assessment; safety properties; safety-critical gas burner control; self-checking; test pattern size; Circuit faults; Circuit simulation; Circuit testing; Complexity theory; Computational modeling; Digital systems; Fault tolerance; Product safety; Quality assessment; Sampling methods;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
Print_ISBN :
0-7695-1831-1
DOI :
10.1109/DFTVS.2002.1173518