• DocumentCode
    3090972
  • Title

    Improved Policies for Drowsy Caches in Embedded Processors

  • Author

    Zushi, Junpei ; Zeng, Gang ; Tomiyama, Hiroyuki ; Takada, Hiroaki ; Inoue, Koji

  • Author_Institution
    Nagoya Univ., Aichi
  • fYear
    2008
  • fDate
    23-25 Jan. 2008
  • Firstpage
    362
  • Lastpage
    367
  • Abstract
    In the design of embedded systems, especially battery- powered systems, it is important to reduce energy consumption. Cache are now used not only in general-purpose processors but also in embedded processors. As feature sizes shrink, the leakage energy has contributed to a significant portion of total energy consumption. To reduce the leakage energy of cache, the Drowsy cache was proposed, in which the cache lines are periodically moved to the low- leakage mode without loss of its content. However, when a cache line in the low-leakage mode is accessed, one or more clock cycles are required to transition the cache line back to the normal mode before its content can be accessed. As a result, these penalty cycles may significantly degrade the cache performance, especially in embedded processors without out-of-order execution. In this paper, we propose four mode transition policies which aim at high energy reduction with the minimum performance degradation. We also compare our policies with existing policies in the context of embedded processors. Experimental results demonstrate the effectiveness of the proposed policies.
  • Keywords
    cache storage; embedded systems; integrated circuit design; low-power electronics; microprocessor chips; battery-powered systems; cache performance; drowsy caches; embedded processors; embedded system design; energy consumption reduction; leakage energy reduction; transition policies; Clocks; Degradation; Delay; Dynamic voltage scaling; Electronic equipment testing; Embedded system; Energy consumption; Information science; Out of order; System testing; Drowsy Cache; Leakage Energy; Low Power Cache Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-0-7695-3110-6
  • Type

    conf

  • DOI
    10.1109/DELTA.2008.70
  • Filename
    4459572