• DocumentCode
    3091045
  • Title

    Emulation-based design errors identification

  • Author

    Castelnuovo, A. ; Fin, A. ; Fummi, F. ; Sforza, F.

  • Author_Institution
    Dynamic Verification Group, STMicroelectronics, Milano, Italy
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    365
  • Lastpage
    371
  • Abstract
    Design verification has a large impact on the final testability of a system. The identification and removal of design errors from the initial design steps increases the testing quality of the entire design flow. We propose in this paper to exploit the potentialities of an emulator to accelerate a validation methodology for RTL designs. Alternative emulator configurations are compared in order to evaluate the performance speed-up of the presented methodology. The RTL design functionalities are compared with a System C executable specification model.
  • Keywords
    automatic test pattern generation; design for testability; formal verification; high level synthesis; logic testing; RTL designs; System C executable specification model; design errors identification; emulation-based design errors; final testability; initial design steps; performance speed-up; testing quality; validation methodology; Acceleration; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Computer errors; Design methodology; Design optimization; Life estimation; Research and development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings. 17th IEEE International Symposium on
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-1831-1
  • Type

    conf

  • DOI
    10.1109/DFTVS.2002.1173533
  • Filename
    1173533