• DocumentCode
    3091109
  • Title

    DWT/PCA Face Recognition using Automatic Coefficient Selection

  • Author

    Nicholl, Paul ; Amira, Abbes

  • Author_Institution
    Queen´´s Univ., Belfast
  • fYear
    2008
  • fDate
    23-25 Jan. 2008
  • Firstpage
    390
  • Lastpage
    393
  • Abstract
    In PCA-based face recognition, there is often a trade-off between selecting the most relevant parts of a face image for recognition and not discarding information which may be useful. The work presented in this paper proposes a method to automatically determine the most discriminative coefficients in a DWT/PCA-based face recognition system, based on their inter-class and intra-class standard deviations. In addition, the eigenfaces used for recognition are generally chosen based on the value of their associated eigenvalues. However, the variance indicated by the eigenvalues may be due to factors such as variation in illumination levels between training set faces, rather than differences that are useful for identification. The work presented proposes a method to automatically determine the most discriminative eigenfaces, based on the inter-class and intra-class standard deviations of the training set eigenface weight vectors. The results obtained using the AT&T database show an improvement over existing DWT/PCA coefficient selection techniques.
  • Keywords
    discrete wavelet transforms; eigenvalues and eigenfunctions; face recognition; principal component analysis; AT&T database; DWT; PCA; automatic coefficient selection; discrete wavelet transform; eigenvalues; face recognition; illumination levels; principal component analysis; Application software; Automatic testing; Discrete wavelet transforms; Eigenvalues and eigenfunctions; Electronic equipment testing; Face recognition; Fingerprint recognition; Hidden Markov models; Independent component analysis; Principal component analysis; discrete wavelet transform; face recognition; principal component analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-0-7695-3110-6
  • Type

    conf

  • DOI
    10.1109/DELTA.2008.39
  • Filename
    4459578