Title :
Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images
Author :
Malik, Aamir Saeed ; Choi, Tae-Sun
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia
Abstract :
Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, shape from focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.
Keywords :
focusing; image texture; lighting; object recognition; reflectivity; depth estimation; focus measures; microscopic images; microscopic objects; passive 3D shape recovery methods; shape from focus; source illumination; texture reflectance effect analysis; Electric variables measurement; Focusing; Image analysis; Image texture analysis; Lenses; Lighting; Microscopy; Reflectivity; Shape measurement; Testing; Depth map estimation; Focus measure; Microscopic images; Shape from focus;
Conference_Titel :
Computer and Electrical Engineering, 2009. ICCEE '09. Second International Conference on
Conference_Location :
Dubai
Print_ISBN :
978-1-4244-5365-8
Electronic_ISBN :
978-0-7695-3925-6
DOI :
10.1109/ICCEE.2009.148
