DocumentCode
3091852
Title
Test Set Stripping Limiting the Maximum Number of Specified Bits
Author
Kochte, Michael A. ; Zoellin, Christian G. ; Imhof, Michael E. ; Wunderlich, Hans-Joachim
Author_Institution
Univ. Stuttgart, Stuttgart
fYear
2008
fDate
23-25 Jan. 2008
Firstpage
581
Lastpage
586
Abstract
This paper presents a technique that limits the maximum number of specified bits of any pattern in a given test set. The outlined method uses algorithms similar to ATPG, but exploits the information in the test set to quickly find test patterns with the desired properties. The resulting test sets show a significant reduction in the maximum number of specified bits in the test patterns. Furthermore, for commercial ATPG test sets even the overall number of specified bits is reduced substantially.
Keywords
automatic test pattern generation; automatic test pattern generation; implication graph; test relaxation; test set stripping; Automatic test pattern generation; Automatic testing; Built-in self-test; Compaction; Electronic equipment testing; Equations; Hardware; Logic testing; Manufacturing; Volume relaxation; Test relaxation; tailored ATPG; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Design, Test and Applications, 2008. DELTA 2008. 4th IEEE International Symposium on
Conference_Location
Hong Kong
Print_ISBN
978-0-7695-3110-6
Type
conf
DOI
10.1109/DELTA.2008.64
Filename
4459617
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