Title :
High Precession Measurement Setup for the Spectral Gain of EDWA in a Low Signal Regime
Author :
Asif, M. Rameez ; Haithem, Mustafa A. ; Zafrullah, M.
Author_Institution :
UNITN, Trento
Abstract :
A high precision measurement setup has been realized especially for the spectral gain of erbium doped waveguide amplifier (EDWA) in a low signal regime. Each part of the set-up is shown in detail from laser light sources, objectives and tapered fibers for performing the coupling task to the light collection system and analyzing the transmitted signal from optical waveguide devices. The main individuality of this setup is that it can be aligned up to 1 nm displacement accuracy with the help of nano-positioner. Also this setup can be used for structural analysis, mode profile, and loss measurements by using different techniques of various Si-based waveguides in different geometries.
Keywords :
microwave amplifiers; nanopositioning; optical waveguides; spectral analysers; EDWA; high precession measurement setup; laser light sources; low signal regime; nanopositioner; spectral gain; Erbium; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Gain measurement; Light sources; Optical amplifiers; Optical devices; Optical fiber devices; Optical waveguides; Waveguide lasers; Erbium Doped Waveguide Amplifier (EWDA); Nano-positioner; Optical Spectrum Analyzer; Spectral Gain; Tunable Laser;
Conference_Titel :
High Capacity Optical Networks and Enabling Technologies, 2008. HONET 2008. International Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-2960-8
Electronic_ISBN :
978-1-4244-2961-5
DOI :
10.1109/HONET.2008.4810222
