Title :
Impact of radiated EMI in high frequency crystal oscillator
Author :
Rohde, Ulrich L. ; Poddar, Ajay K.
Author_Institution :
Synergy Microwave Corp., Paterson, NJ, USA
Abstract :
The high frequency (HF) crystal oscillator is susceptive to electromagnetic interference (EMI), which affects the stability or accuracy of reference frequency standards. The effect of radiated EMI can be both deterministic and random in nature that shows up as jitter in the time domain and phase noise in the frequency domain. In this paper, we studied the impact of radiated EMI in 155.6 MHz crystal oscillator (XO) and the design consideration for EMI and jitter insensitive signal sources for reference frequency standard applications.
Keywords :
crystal oscillators; electromagnetic interference; electromagnetic interference; frequency 155.6 MHz; frequency domain; high frequency crystal oscillator; jitter insensitive signal sources; phase noise; radiated EMI; reference frequency standard applications; time domain; Bit error rate; Clocks; Electromagnetic interference; Frequency domain analysis; Jitter; Magnetic field measurement; Microwave oscillators; Phase noise; Printed circuits; Radio frequency; Crystal Oscillator; EMI; HF; XO;
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2010.5515060
