DocumentCode
3092871
Title
ISQED 2009 conference at a glance
fYear
2009
fDate
16-18 March 2009
Abstract
Provides a schedule of conference events and a listing of which papers were presented in each session.
Keywords
Aging; Circuit noise; Integrated circuit noise; Libraries; Low voltage; Noise robustness; Power system modeling; Power system planning; Power system reliability; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2952-3
Type
conf
DOI
10.1109/ISQED.2009.4810259
Filename
4810259
Link To Document