DocumentCode :
3093167
Title :
A Unified Method Based on Wavelet Transform and C-V Model for Crack Segmentation of 3D Industrial CT Images
Author :
Liu, Linghui ; Zeng, Li ; Bi, Bi
Author_Institution :
ICT Res. Center, Chongqing Univ., Chongqing, China
fYear :
2011
fDate :
12-15 Aug. 2011
Firstpage :
12
Lastpage :
16
Abstract :
Accurate segmentation of cracked body from three-dimensional (3D) industrial Computed Tomography (CT) images is an important step in the process of crack measurement and automatic recognition. In this paper we present a fast method for the segmentation of cracked body. The improved algorithm incorporates wavelet transform and Chan and Vese (C-V) model as key components. The 3D wavelet transform is applied for detecting rough edges. Then region growing is used to find a suitable region which contains cracked body. Based on the resulting volume data, 3D C-V model is used to capture the edges of cracked body. The improved method can locate rough regions by using wavelet modulus maxima, which not only reduces the amount of data C-V model processed, but also provides initial contour surface that can accelerate the convergence speed of C-V model. Experimental results illustrate our method can accurately detect the cracked surface, as well as give computational savings of segmentation which satisfy the demand of defects detection of industrial CT.
Keywords :
computerised tomography; crack detection; edge detection; image segmentation; production engineering computing; wavelet transforms; 3D C-V model; 3D industrial CT images; 3D wavelet transform; Chan and Vese model; automatic recognition; crack measurement; crack segmentation; three-dimensional industrial computed tomography images; wavelet modulus maxima; Capacitance-voltage characteristics; Computed tomography; Image edge detection; Image segmentation; Three dimensional displays; Wavelet transforms; 3D Industrial CT Images; C-V Model; Wavelet Transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Graphics (ICIG), 2011 Sixth International Conference on
Conference_Location :
Hefei, Anhui
Print_ISBN :
978-1-4577-1560-0
Electronic_ISBN :
978-0-7695-4541-7
Type :
conf
DOI :
10.1109/ICIG.2011.25
Filename :
6005546
Link To Document :
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