• DocumentCode
    3093331
  • Title

    Parameter tuning in SVM-based power macro-modeling

  • Author

    Gusmão, António ; Silveira, L. Miguel ; Monteiro, José

  • Author_Institution
    TU Lisbon, IST / INESC-ID, Lisbon
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    135
  • Lastpage
    140
  • Abstract
    We investigate the use of support vector machines (SVMs) to determine simpler and better fit power macromodels of functional units for high-level power estimation. The basic approach is first to obtain the power consumption of the module for a large number of points in the input signal space. Least-squares SVMs are then used to compute the best model to fit this set of points. We have performed extensive experiments in order to determine the best parameters for the kernels. Based on this analysis, we propose an iterative method of improving the model by selectively adding new support vectors and increasing the sharpness of the model. The macromodels obtained confirm the excellent modelling capabilities of the proposed kernel-based method, providing both excellent accuracy on maximum error (close to 17%) and average (2% error), which represents an improvement over the state-of-the-art. Furthermore, we present an analysis of the dynamic range of power consumption for the benchmarks circuits, which serves to confirm that the model is able to accommodate circuits exhibiting a more skewed power distribution.
  • Keywords
    digital circuits; iterative methods; least squares approximations; power consumption; support vector machines; high-level power estimation; iterative method; least-squares method; parameter tuning; power consumption; power macro-modeling; support vector machines; Circuits; Clustering algorithms; Dynamic range; Energy consumption; Iterative methods; Kernel; Machine learning; Machine learning algorithms; Statistics; Support vector machines; Macro-Model; Power Estimation; Support Vector Machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810283
  • Filename
    4810283