• DocumentCode
    3094333
  • Title

    Dual-buck full-bridge inverter with SPWM control and single current sensor

  • Author

    Yao, Zhilei ; Xiao, Lan ; Wei, Xing ; Wang, Huizhen

  • Author_Institution
    Coll. of Autom. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    2154
  • Lastpage
    2158
  • Abstract
    This paper presents a dual-buck full-bridge inverter (DBFBI) with the sinusoidal pulse width modulation (SPWM) and single current sensor. Shoot-through problem does not exist. All the power devices and filter inductors operate at each half line cycle, thus the efficiency can be increased. Only one switch works at high frequency when the reference current and the output voltage have the same polarity, and thus the switching loss can be reduced. The freewheeling current flows through the independent diodes instead of the body diodes of the switches, so reverse recovery losses of the diodes can be decreased. Only one current sensor is used, hence the cost of the DBFBI could be reduced compared with the conventional control method. The SPWM control is adopted, thus the output filter is easy to design. The operating principle is illustrated. Finally, simulation results of a 1-kVA DBFBI verify the theoretical analysis.
  • Keywords
    PWM invertors; PWM power convertors; diodes; electric sensing devices; switches; SPWM control; apparent power 1 kVA; dual-buck full-bridge inverter; filter inductors; half line cycle; independent diodes; output filter; power converter; power devices; shoot-through problem; single current sensor; sinusoidal pulse width modulation; switches; switching loss; Costs; Diodes; Frequency; Inductors; Power filters; Pulse inverters; Pulse width modulation inverters; Switches; Switching loss; Voltage; full-bridge; inverter; power converters; sensors; sinusoidal pulse width modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5515165
  • Filename
    5515165