• DocumentCode
    3094533
  • Title

    Optimization strategies to improve statistical timing

  • Author

    Viswanath, Parimala ; Murthy, Pranav ; Das, Debajit ; Venkatraman, R. ; Mandal, Ajoy ; Veeravalli, Arvind ; Udayakumar, H.

  • Author_Institution
    Texas Instrum. India Ltd., Bangalore
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    476
  • Lastpage
    481
  • Abstract
    Statistical static timing analysis (SSTA) has been used in practice as an extension to regular static timing analysis (STA) to analyse for the impact of process variations on timing in new process nodes. However, the use of statistical timing in design optimization is a challenge that chip design teams face. In this paper, we propose some approaches to enable the comprehension of statistical timing behaviour during optimization. We indicate how the design standard-cell library can be analysed for variation, to help in understanding the robustness of cells, and in enabling the use of the correct logic architectures. We then propose an approach to comprehend the statistical timing behaviour in conventional (static-timing-based) optimization engines. We show how this method helps in optimising the overall area of the design, while simultaneously improving the timing characteristics. We also indicate a complementary approach of incrementally optimising the design using the statistical characteristics of the library as an added cost for sizing. We show how these approaches resulted in a 9.1% reduction in design area, and a direct improvement in statistical timing of a complex real-life design.
  • Keywords
    logic design; optimisation; statistical analysis; design standard-cell library; optimization strategy; statistical static timing analysis; Chip scale packaging; Circuit analysis; Delay; Design optimization; Engines; Instruments; Libraries; Logic design; Robustness; Timing; QoR; SSTA; statistical optimisation; timing optimisation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810341
  • Filename
    4810341