• DocumentCode
    3094565
  • Title

    Buffer/flip-flop block planning for power-integrity-driven floorplanning

  • Author

    Pan, Hsin-Hua ; Chen, Hung-Ming ; Chang, Chia-Yi

  • Author_Institution
    Hsinchu Sci.-Based Ind. Park, AnaGlobe Technol., Inc., Hsinchu
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    488
  • Lastpage
    493
  • Abstract
    As the technology scaled down, it is known that interconnect has become the dominant factor in determining the overall circuit performance and complexity. Buffer insertion is one of very effective and useful techniques to improve the interconnect performance. In order to find better places for buffers to be inserted, the buffer insertion stage during floorplanning usually clusters buffers in a region, which may cause additional IR-drop violation. On the other hand, in complex digital system with relatively large die areas operating at very high frequencies, many global signals traveling across the chip need several clock cycles to reach their destinations, thus requiring the adoption of pipelined interconnects. Together with the buffer stations/blocks, the increasing number of flip-flops will cause further voltage drop violation. In this paper, we propose a methodology to pipeline interconnect during the floorplan stage and consider the IR-drop during the planning of buffers and flip-flops at the same time. The experimental results show that our method can get a low system latency with power integrity preservation in 90 nm technology node.
  • Keywords
    buffer circuits; circuit complexity; circuit layout; flip-flops; IR-drop; buffer insertion; buffer/flip-flop block planning; circuit complexity; circuit performance; pipeline interconnect; power integrity preservation; power-integrity-driven floorplanning; voltage drop violation; Circuit optimization; Clocks; Digital systems; Flip-flops; Frequency; Integrated circuit interconnections; Pipelines; Power system interconnection; Power system planning; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810343
  • Filename
    4810343