DocumentCode
3094565
Title
Buffer/flip-flop block planning for power-integrity-driven floorplanning
Author
Pan, Hsin-Hua ; Chen, Hung-Ming ; Chang, Chia-Yi
Author_Institution
Hsinchu Sci.-Based Ind. Park, AnaGlobe Technol., Inc., Hsinchu
fYear
2009
fDate
16-18 March 2009
Firstpage
488
Lastpage
493
Abstract
As the technology scaled down, it is known that interconnect has become the dominant factor in determining the overall circuit performance and complexity. Buffer insertion is one of very effective and useful techniques to improve the interconnect performance. In order to find better places for buffers to be inserted, the buffer insertion stage during floorplanning usually clusters buffers in a region, which may cause additional IR-drop violation. On the other hand, in complex digital system with relatively large die areas operating at very high frequencies, many global signals traveling across the chip need several clock cycles to reach their destinations, thus requiring the adoption of pipelined interconnects. Together with the buffer stations/blocks, the increasing number of flip-flops will cause further voltage drop violation. In this paper, we propose a methodology to pipeline interconnect during the floorplan stage and consider the IR-drop during the planning of buffers and flip-flops at the same time. The experimental results show that our method can get a low system latency with power integrity preservation in 90 nm technology node.
Keywords
buffer circuits; circuit complexity; circuit layout; flip-flops; IR-drop; buffer insertion; buffer/flip-flop block planning; circuit complexity; circuit performance; pipeline interconnect; power integrity preservation; power-integrity-driven floorplanning; voltage drop violation; Circuit optimization; Clocks; Digital systems; Flip-flops; Frequency; Integrated circuit interconnections; Pipelines; Power system interconnection; Power system planning; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2952-3
Electronic_ISBN
978-1-4244-2953-0
Type
conf
DOI
10.1109/ISQED.2009.4810343
Filename
4810343
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