DocumentCode :
3094807
Title :
Double-gate SOI devices for low-power and high-performance applications
Author :
Roy, Kaushik ; Mahmoodi, Hamid ; Mukhopadhyay, Saibal ; Ananthan, Hari ; Bansal, Aditya ; Cakici, Tamer
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2006
fDate :
3-7 Jan. 2006
Abstract :
Double-gate (DG) transistors have emerged as promising devices for nano-scale circuits due to their better scalability compared to bulk CMOS. Among the various types of DG devices, quasi-planar SOI FinFETs are easier to manufacture compared to planar double-gate devices. DG devices with independent gates (separate contacts to back and front gates) have recently been developed. DG devices with symmetric and asymmetric gates have also been demonstrated. Such device options have direct implications at the circuit level. Independent control of front and back gate in DG devices can be effectively used to improve performance and reduce power in sub-50nm circuits. Independent gate control can be used to merge parallel transistors in non-critical paths. This results in reduction in the effective switching capacitance and hence power dissipation. We show a variety of circuits in logic and memory that can benefit from independent gate operation of DG devices. As examples, we show the benefit of independent gate operation in circuits such as dynamic logic circuits, Schmitt triggers, sense amplifiers, and SRAM cells. In addition to independent gate option, we also investigate the usefulness of asymmetric devices and the impact of width quantization and process variations on circuit design.
Keywords :
MOSFET; low-power electronics; nanoelectronics; silicon-on-insulator; asymmetric gates; bulk CMOS; circuit design; double-gate SOI devices; double-gate transistors; independent gate control; logic circuits; memory circuits; nanoscale circuits; parallel transistors; process variations; quasiplanar SOI FinFET; switching capacitance; symmetric gates; Capacitance; FinFETs; Logic circuits; Logic devices; Manufacturing; Nanoscale devices; Operational amplifiers; Power dissipation; Scalability; Trigger circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on
ISSN :
1063-9667
Print_ISBN :
0-7695-2502-4
Type :
conf
DOI :
10.1109/VLSID.2006.74
Filename :
1581491
Link To Document :
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