• DocumentCode
    3095010
  • Title

    A computer vision system for automatic steel surface inspection

  • Author

    Liu, Yung-Chun ; Hsu, Yu-Lu ; Sun, Yung-Nien ; Tsai, Song-Jan ; Ho, Chiu-Yi ; Chen, Chung-Mei

  • Author_Institution
    Comput. Sci. & Inf. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
  • fYear
    2010
  • fDate
    15-17 June 2010
  • Firstpage
    1667
  • Lastpage
    1670
  • Abstract
    Automatic inspection on line plays an important role in industrial quality management nowadays. This paper proposes a new computer vision system for automatic steel surface inspection. The system analyzes the images sequentially acquired from steel bar to detect different kinds of defects on the steel surface. Several image processing strategies are used to detect and outline the defects. The detected defects are then classified into different defect types by using a hierarchical neural network classifier. Some manual detection results by field experts are used to verify the correctness of the proposed detection. In defect classification, the results show that the relevance vector machine (RVM) has better accuracy than the back propagation neural network (BPN). The proposed algorithm was found capable of detecting defects on steel surface rapidly and precisely.
  • Keywords
    backpropagation; computer vision; image classification; image sequences; neural nets; steel industry; support vector machines; automatic steel surface inspection; backpropagation neural network; computer vision system; hierarchical neural network classifier; image sequence; industrial quality management; relevance vector machine; steel surface defect classification; Computer vision; Feature extraction; Inspection; Neural networks; Production; Steel; Strips; Sun; Support vector machine classification; Support vector machines; defect detection; neural network; relevance vector machine; steel surface inspection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2010 the 5th IEEE Conference on
  • Conference_Location
    Taichung
  • Print_ISBN
    978-1-4244-5045-9
  • Electronic_ISBN
    978-1-4244-5046-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2010.5515197
  • Filename
    5515197