DocumentCode :
30951
Title :
Exploring Silicon Nanophotonics in Throughput Architecture
Author :
Goswami, Nilanjan ; Zhongqi Li ; Shankar, Ramkumar ; Tao Li
Author_Institution :
Univ. of Florida, Gainesville, FL, USA
Volume :
31
Issue :
5
fYear :
2014
fDate :
Oct. 2014
Firstpage :
18
Lastpage :
27
Abstract :
In high-performance throughput processors, the interconnect experiences power and energy bottlenecks due to massive parallelism and ever-increasing memory accesses in emerging workloads. Also, high-performance throughput processors have exposed bandwidth and latency bottlenecks in on-chip interconnect and off-chip memory access. To eliminate such bottlenecks, we propose silicon nanophotonics and 3-D stacking technologies in throughput architecture. It provides higher communication bandwidth and lower latency signaling mechanisms at reduced power. We evaluate a 3-D stacked GPU with 2048 SIMD cores having photonic interconnect. The photonic multiple-writer-single-reader crossbar network with 32-B channel bandwidth on average achieves 91% network power reduction. In addition, it improves average core-to-memory access latency by 59% and 87% for northbound and southbound traffic, respectively. We anticipate that for emerging workloads and microarchitectures the implications of the proposed ideas are far reaching.
Keywords :
elemental semiconductors; graphics processing units; integrated optics; nanophotonics; optical interconnections; silicon; 3D stacked GPU; 3D stacking technology; SIMD cores; Si; average core-to-memory access latency; communication bandwidth; high-performance throughput processors; latency signaling mechanisms; microarchitectures; network power reduction; northbound traffic; off-chip memory access; on-chip interconnect; photonic interconnect; photonic multiple-writer-single-reader crossbar network; silicon nanophotonics; southbound traffic; throughput architecture; Bandwidth allocation; Multicore processing; Nanophotonics; Optical buffering; Optical interconnections; Optical waveguides; Silicon;
fLanguage :
English
Journal_Title :
Design & Test, IEEE
Publisher :
ieee
ISSN :
2168-2356
Type :
jour
DOI :
10.1109/MDAT.2014.2348312
Filename :
6879336
Link To Document :
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