• DocumentCode
    3095183
  • Title

    Effects of bulk wave radiation on IDT admittance on 36°YX-LiTaO 3

  • Author

    Hashimoto, Ken-Ya ; Yamaguchi, Masatsune ; Kovacs, Gunter ; Wagner, Karl Christian ; Ruile, Werner ; Weigel, Robert

  • Author_Institution
    Dept. of Electron. & Mech. Eng., Chiba Univ., Japan
  • Volume
    1
  • fYear
    2000
  • fDate
    36800
  • Firstpage
    253
  • Abstract
    This paper investigates the effects of bulk acoustic wave (BAW) radiation on the admittance of interdigital transducers (IDTs) with significant internal reflections of shear horizontal type (SH-type) leaky surface acoustic waves (SAWs) on 36°YX-LiTaO3 (36-LT). Theoretical analysis is made by using the discrete Green function theory, and synchronous one-port resonators are analyzed. It is shown that the BAW radiation significantly affects the IDT characteristics even for resonators; under certain circumstances, BAWs launched from an IDT are converted into SH-type SAWs by the strong internal reflections, and they interact with the BAWs radiated by the IDT. Then the net amount of the radiated BAW power is highly dependent upon the number of IDT finger pairs. For the precise simulation of devices based on the SH-type SAWs with strong internal reflections, the BAW radiation should carefully be taken into consideration
  • Keywords
    Green´s function methods; bulk acoustic wave devices; interdigital transducers; lithium compounds; surface acoustic wave resonators; surface acoustic wave transducers; LiTaO3; admittance; bulk acoustic wave radiation; discrete Green function; interdigital transducer; internal reflection; shear horizontal leaky surface acoustic wave; synchronous one-port resonator; Acoustic propagation; Acoustic waves; Admittance; Electric potential; Equations; Frequency; Gratings; Permittivity; Sawing machines; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2000 IEEE
  • Conference_Location
    San Juan
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-6365-5
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2000.922551
  • Filename
    922551