DocumentCode
3095193
Title
Design planning for uniform thermal distribution
Author
Patrikar, Rajendra M. ; Peyran, Olivier
Author_Institution
Dept. of Electron. & Comput. Sci., Visvesaraya Nat. Inst. of Technol., Nagpur, India
fYear
2006
fDate
3-7 Jan. 2006
Abstract
Thermal distribution has become an important reliability concern for today´s integrated circuits. In traditional design flows, the temperature of the chip is assumed to be uniform across the substrate. However, non-uniform thermal distribution can be a major source of inaccuracy in delay and clock skew computations, and can have an impact on electro-migration reliability and self-heating effects. Hence, it has become necessary to obtain design with uniform temperature distribution to ensure minimum temperature gradient and avoid hot spots across the chip area. The uniform temperature distribution can be achieved by appropriate placement of circuit blocks during the physical design. However, placement should take into account factors such as area, aspect ratio and timing closure issues. Thus the design process becomes a multi-objective optimization problem, which we are solving using a genetic algorithm.
Keywords
circuit optimisation; electromigration; genetic algorithms; integrated circuit design; integrated circuit reliability; temperature distribution; electro-migration reliability; genetic algorithm; hot spots; integrated circuits; multiobjective optimization problem; self-heating effects; temperature distribution; temperature gradient; uniform thermal distribution; Algorithm design and analysis; Clocks; Delay effects; Design optimization; Distributed computing; Genetic algorithms; Integrated circuit reliability; Process design; Temperature distribution; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on
ISSN
1063-9667
Print_ISBN
0-7695-2502-4
Type
conf
DOI
10.1109/VLSID.2006.70
Filename
1581511
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