• DocumentCode
    3095201
  • Title

    Temperature effects on energy optimization in sub-threshold circuit design

  • Author

    Datta, Basab ; Burleson, Wayne

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Massachusetts-Amherst, Amherst, MA
  • fYear
    2009
  • fDate
    16-18 March 2009
  • Firstpage
    680
  • Lastpage
    685
  • Abstract
    Sub-threshold circuits have emerged as a strong candidate for use in future energy-constrained applications. In a non-homogeneous design paradigm containing both sub-threshold and high power-density super-threshold blocks, it becomes imperative to examine the thermal effects on sub-threshold operation. In this paper, we investigate the thermal impact on sub-threshold current, delay and energy and develop analytical models of the same. Unlike super-threshold, the sub-threshold ION increases exponentially with temperature while the ION-to-IOFF ratio degrades by 0.52%degC. While delay decreases, energy increases with temperature due to relative increase in leakage power at the higher temperatures. Studies performed on noise-margins, current/delay variability and sub-Vth interconnects suggest that sub-Vth circuits can retain {power, delay, energy} optimality over a relatively high temperature range of 25-75degC.
  • Keywords
    delays; integrated circuit design; energy optimization; high power-density super-threshold blocks; leakage power; subthreshold circuit design; temperature 25 degC to 75 degC; temperature effects; Circuit synthesis; Delay; Design optimization; Integrated circuit interconnections; Logic circuits; Optimization methods; Robustness; Temperature; Thermal stresses; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2952-3
  • Electronic_ISBN
    978-1-4244-2953-0
  • Type

    conf

  • DOI
    10.1109/ISQED.2009.4810375
  • Filename
    4810375