DocumentCode :
3095201
Title :
Temperature effects on energy optimization in sub-threshold circuit design
Author :
Datta, Basab ; Burleson, Wayne
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Massachusetts-Amherst, Amherst, MA
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
680
Lastpage :
685
Abstract :
Sub-threshold circuits have emerged as a strong candidate for use in future energy-constrained applications. In a non-homogeneous design paradigm containing both sub-threshold and high power-density super-threshold blocks, it becomes imperative to examine the thermal effects on sub-threshold operation. In this paper, we investigate the thermal impact on sub-threshold current, delay and energy and develop analytical models of the same. Unlike super-threshold, the sub-threshold ION increases exponentially with temperature while the ION-to-IOFF ratio degrades by 0.52%degC. While delay decreases, energy increases with temperature due to relative increase in leakage power at the higher temperatures. Studies performed on noise-margins, current/delay variability and sub-Vth interconnects suggest that sub-Vth circuits can retain {power, delay, energy} optimality over a relatively high temperature range of 25-75degC.
Keywords :
delays; integrated circuit design; energy optimization; high power-density super-threshold blocks; leakage power; subthreshold circuit design; temperature 25 degC to 75 degC; temperature effects; Circuit synthesis; Delay; Design optimization; Integrated circuit interconnections; Logic circuits; Optimization methods; Robustness; Temperature; Thermal stresses; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810375
Filename :
4810375
Link To Document :
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