• DocumentCode
    3095306
  • Title

    Identification of Vulnerable Lines in Power Grid Based on Complex Network Theory

  • Author

    Chen, Xiaogang ; Sun, Ke ; Cao, Yijia ; Wang, Shaobu

  • Author_Institution
    Dept. of Electr. Eng., Zhejiang Univ., Hangzhou
  • fYear
    2007
  • fDate
    24-28 June 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Some critical lines can have important impact on the large-scale blackouts and cascading failures in power grid. Based on the newest progress in the field of complex network, a new vulnerability index called weighted line betweenness is proposed as vulnerability index in this paper. The weighted line betweenness of one line is defined as the sum of the loads acted on this line, which are brought by the shortest electric paths between generator nodes and load nodes that passing through this line. We revise the weighted line betweenness by increasing the betweenness to the highest betweenness in the neighboring lines before revision. Vulnerability analysis has been carried out on the IEEE 39 bus system and Huazhong-Chuanyu power grid. The time domain simulation results verify that the weighted line betweenness can not only identify the most critical lines but also find out those light loaded but critical lines due to their special position in the power grid.
  • Keywords
    complex networks; network theory (graphs); power grids; power system faults; power system stability; time-domain analysis; IEEE 39 bus system; cascading failures; complex network theory; generator nodes; load nodes; power grid; shortest electric paths; time domain simulation; vulnerability index; weighted line betweenness; Complex networks; Failure analysis; Frequency; Network topology; Power grids; Power system faults; Power system modeling; Power system protection; Power system reliability; Sun; Blackout; Complex network; Power system stability; Vulnerable Line;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society General Meeting, 2007. IEEE
  • Conference_Location
    Tampa, FL
  • ISSN
    1932-5517
  • Print_ISBN
    1-4244-1296-X
  • Electronic_ISBN
    1932-5517
  • Type

    conf

  • DOI
    10.1109/PES.2007.385733
  • Filename
    4275499