DocumentCode :
3095491
Title :
Parallel partitioning based on-chip power distribution network analysis using locality acceleration
Author :
Zeng, Zhiyu ; Li, Peng ; Feng, Zhuo
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A & M Univ., College Station, TX
fYear :
2009
fDate :
16-18 March 2009
Firstpage :
776
Lastpage :
781
Abstract :
Large VLSI on-chip power distribution networks (PDN) are challenging to analyze due to the sheer network complexity. In this paper, a novel parallel partitioning based PDN analysis approach is presented. We use the boundary circuit responses of each partition to divide the full grid simulation problem into a set of independent sub grid simulation problems. Instead of solving exact boundary circuit responses, a more efficient scheme to provide near exact approximation to the boundary circuit responses by exploiting the spatial locality of the flip-chip type power grids is proposed, in which only several small sub power grids need to be solved. This scheme is also used in a block based iterative error reduction process to improve the convergence. Through the analysis of several large power grids, the proposed approach, which can be fully parallelizable, is shown to have great runtime efficiency, fast convergence, and favorable scalability. Our approach can solve a 7.2 million-node power grid in 26 seconds, which is 18 times faster than a state of the art direct solver.
Keywords :
VLSI; distribution networks; flip-chip devices; iterative methods; parallel programming; power grids; VLSI; block based iterative error reduction; boundary circuit responses; flip-chip type power grids; full grid simulation; locality acceleration; on-chip power distribution network; parallel partitioning; sub grid simulation; Acceleration; Circuit simulation; Convergence; Gradient methods; Network-on-a-chip; Power grids; Power systems; Runtime; Scalability; Very large scale integration; DC analysis; Parallel; flip-chip; locality; on-chip; power distribution network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality of Electronic Design, 2009. ISQED 2009. Quality Electronic Design
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-2952-3
Electronic_ISBN :
978-1-4244-2953-0
Type :
conf
DOI :
10.1109/ISQED.2009.4810391
Filename :
4810391
Link To Document :
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