• DocumentCode
    3095512
  • Title

    Fault Tolerant Reconfiguration System for Asymmetric Multilevel Converters Using Bi-Directional Power Switches

  • Author

    Dixon, Juan ; Barriuso, Pablo ; Ortuzar, Micah ; Moran, Luis ; Pontt, Jorge ; Rodriguez, Jose

  • Author_Institution
    Pontificia Univ. Catolica de Chile, Santiago
  • fYear
    2007
  • fDate
    5-8 Nov. 2007
  • Firstpage
    2124
  • Lastpage
    2129
  • Abstract
    Asymmetric multilevel converters can optimise the number of levels by using H bridges scaled in power of three. The shortcoming of this topology is that the H bridges are not interchangeable and then, under certain faulty conditions, the converter cannot operate. A reconfiguration system based on bi-directional electronic valves has been designed for a 3-phase cascaded H-bridges. Once a fault is detected in any of the IGBTs of any H- bridge, the control is capable to reconfigure the hardware at the faulty phase by means of eliminating the damaged bridge. If the faulty bridge is not the smallest one, then the bi-directional-valve system reconfigure the faulty phase to keep the higher power bridges in operation. In this way, that phase can continue working at the same voltage level by adjusting its gating signals. Some simulations and experiments with a 27-level inverter, to show the operation of the system under a faulty condition, are displayed.
  • Keywords
    bridge circuits; cascade networks; fault tolerance; insulated gate bipolar transistors; switching convertors; 3-phase cascaded H-bridges; IGBT; asymmetric multilevel converters; bidirectional electronic valves; bidirectional power switches; fault tolerant reconfiguration system; Bidirectional control; Bridge circuits; Circuit topology; Fault detection; Fault tolerant systems; Hardware; Insulated gate bipolar transistors; Phase detection; Switching converters; Valves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics Society, 2007. IECON 2007. 33rd Annual Conference of the IEEE
  • Conference_Location
    Taipei
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0783-4
  • Type

    conf

  • DOI
    10.1109/IECON.2007.4459999
  • Filename
    4459999