• DocumentCode
    3096060
  • Title

    PIDISC: pattern independent design independent seed compression technique

  • Author

    Balakrishnan, Kedarnath J. ; Wang, Seongmoon ; Chakradhar, Srimat T.

  • Author_Institution
    NEC Labs. America, Princeton, NJ, USA
  • fYear
    2006
  • fDate
    3-7 Jan. 2006
  • Abstract
    A novel scheme for compressing the seeds of a linear feedback shifter register (LFSR) is presented. Instead of storing the seeds of the LFSR in the tester, the scheme compresses the seeds and stores them in the tester. The compression scheme can be used with any variation of static LFSR reseeding. An important feature of the proposed scheme is that the decompressor is test pattern and design independent and can be implemented with very little area overhead. Experimental results show that seed compression can improve overall compression by a factor of 7× for large industrial circuits.
  • Keywords
    logic testing; shift registers; PIDISC; linear feedback shifter register; pattern independent design independent seed compression; static LFSR reseeding; test pattern; Circuit testing; Costs; Equations; Feedback; Laboratories; Manufacturing industries; National electric code; Phase shifters; Test data compression; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-7695-2502-4
  • Type

    conf

  • DOI
    10.1109/VLSID.2006.135
  • Filename
    1581560