DocumentCode
3096060
Title
PIDISC: pattern independent design independent seed compression technique
Author
Balakrishnan, Kedarnath J. ; Wang, Seongmoon ; Chakradhar, Srimat T.
Author_Institution
NEC Labs. America, Princeton, NJ, USA
fYear
2006
fDate
3-7 Jan. 2006
Abstract
A novel scheme for compressing the seeds of a linear feedback shifter register (LFSR) is presented. Instead of storing the seeds of the LFSR in the tester, the scheme compresses the seeds and stores them in the tester. The compression scheme can be used with any variation of static LFSR reseeding. An important feature of the proposed scheme is that the decompressor is test pattern and design independent and can be implemented with very little area overhead. Experimental results show that seed compression can improve overall compression by a factor of 7× for large industrial circuits.
Keywords
logic testing; shift registers; PIDISC; linear feedback shifter register; pattern independent design independent seed compression; static LFSR reseeding; test pattern; Circuit testing; Costs; Equations; Feedback; Laboratories; Manufacturing industries; National electric code; Phase shifters; Test data compression; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 2006. Held jointly with 5th International Conference on Embedded Systems and Design., 19th International Conference on
ISSN
1063-9667
Print_ISBN
0-7695-2502-4
Type
conf
DOI
10.1109/VLSID.2006.135
Filename
1581560
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