Title :
Improved bulk acoustic wave resonator using edge method for high performance
Author :
Moonchul Lee ; Insang Song ; Jea-Shik Shin ; Hosoo Park ; Sang Uk Son ; Chul-Soo Kim ; Duck-Hwan Kim ; Jing Cui ; Yujie Ai
Author_Institution :
Samsung Adv. Inst. of Technol., Yongin, South Korea
Abstract :
We investigate the performance of aluminum nitride (AlN) resonator based bulk acoustic wave (BAW) structure made with air edge reflector and gold (Au) edge electrode. BAW Resonators have been fabricated, some devices using a thick film of e-beam evaporated gold as edge electrodes at the border of the resonator on bottom, top electrode. The air reflectors provided at the border of the resonator suppress the acoustic wave leakage through lateral direction. We have developed the simulation and measurement for the improving of resonator quality. The influence of the frame width on resonator surface after applied the air edge reflector and the gold edge electrode in the performance of the BAW resonators is analyzed. The Qa (Q-factor at anti-resonance frequency) and the effective electro-mechanical coupling coefficient (kt2) which is essential to achieve low loss and wide band-width of RF filters is increased by 19 % and 3.4 %, respectively. Also, Insertion loss at S21 parameter is improved significantly from -0.095 dB to -0.041 dB.
Keywords :
III-V semiconductors; aluminium compounds; bulk acoustic wave devices; electrodes; gold; resonators; wide band gap semiconductors; AlN; Au; BAW resonators; RF filters; acoustic wave leakage; air edge reflector; aluminum nitride resonator; anti-resonance frequency; bulk acoustic wave resonator; bulk acoustic wave structure; e-beam evaporated gold; edge method; electro-mechanical coupling coefficient; frame width; gold edge electrode; insertion loss; lateral direction; resonator quality; resonator surface; thick film; Acoustic waves; Electrodes; Gold; Insertion loss; Radio frequency; Resonator filters; air edge reflector; au electrode; border frame; bulk acoustic wave; resonator; rf filter; spurious resonance;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1330-9
Electronic_ISBN :
978-1-4577-1331-6
DOI :
10.1109/APMC.2012.6421650