DocumentCode :
3096906
Title :
State-of-art, challenges and future directions in large signal measurements for active device modeling
Author :
Schreurs, Dominique
Author_Institution :
Div. ESAT-TELEMIC, K.U. Leuven, Leuven, Belgium
fYear :
2010
fDate :
23-28 May 2010
Firstpage :
1210
Lastpage :
1213
Abstract :
Vector non-linear measurements emerged two decades ago, initiating a vast range of novel applications in microwave characterisation, modeling, and design. This paper focuses on its impact on microwave active device modeling. After sketching the evolution in instrumentation, the present capabilities are described. Today´s developments are happening swiftly and on a large scale. As communication becomes more low-power, more wireless, and more bandwidth demanding, requirements for device models have evolved as well. In this paper, the present challenges in modeling and thus directions in instrumentation development are discussed.
Keywords :
microwave devices; microwave measurement; instrumentation development; large signal measurements; microwave active device modeling; Frequency measurement; Instruments; Microwave devices; Microwave measurements; Oscilloscopes; Power measurement; Pulse measurements; Sampling methods; Time measurement; Voltage; Active devices; behavioral modeling; non-linear circuits; non-linear measurements; non-linear modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International
Conference_Location :
Anaheim, CA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-6056-4
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2010.5515304
Filename :
5515304
Link To Document :
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