Analog fault detectability based on statistical circuit analysis

Author

Papakostas, D.K. ; Kosmidis, V.C. ; Hatzopoulos, A.A.

Author_Institution

Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece

Volume

2

fYear

1996

fDate

13-16 Oct 1996

Firstpage

1076

Abstract

Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability of various analog measurements. Since the method is a simulation-before-test approach, its computational complexity can be considered acceptable utilizing modern computer systems. Parameter deviations and multiple Monte-Carlo analysis are properly handled by a shell program, named MPCAP, which uses the SPICE simulator as a kernel. Theoretical analysis for the calculation of the probabilities is given, along with simulation results from an analog filter example

Keywords

Monte Carlo methods; analogue integrated circuits; automatic testing; circuit analysis computing; fault diagnosis; integrated circuit testing; probability; statistical analysis; MPCAP; SPICE simulator kernel; analog fault detectability; computational complexity; fault detection probability; multi-parameter circuit simulation; multiple Monte-Carlo analysis; probabilities; shell program; statistical circuit analysis; Analytical models; Circuit analysis; Circuit simulation; Computational complexity; Computational modeling; Computer simulation; Electrical fault detection; Kernel; Probability; SPICE;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on

Conference_Location

Rodos

Print_ISBN

0-7803-3650-X

Type

conf

DOI

10.1109/ICECS.1996.584607

Filename

584607