Title :
Analog fault detectability based on statistical circuit analysis
Author :
Papakostas, D.K. ; Kosmidis, V.C. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotelian Univ. of Thessaloniki, Greece
Abstract :
Statistical multi-parameter circuit simulation is used in this work, in order to estimate the fault detection probability of various analog measurements. Since the method is a simulation-before-test approach, its computational complexity can be considered acceptable utilizing modern computer systems. Parameter deviations and multiple Monte-Carlo analysis are properly handled by a shell program, named MPCAP, which uses the SPICE simulator as a kernel. Theoretical analysis for the calculation of the probabilities is given, along with simulation results from an analog filter example
Keywords :
Monte Carlo methods; analogue integrated circuits; automatic testing; circuit analysis computing; fault diagnosis; integrated circuit testing; probability; statistical analysis; MPCAP; SPICE simulator kernel; analog fault detectability; computational complexity; fault detection probability; multi-parameter circuit simulation; multiple Monte-Carlo analysis; probabilities; shell program; statistical circuit analysis; Analytical models; Circuit analysis; Circuit simulation; Computational complexity; Computational modeling; Computer simulation; Electrical fault detection; Kernel; Probability; SPICE;
Conference_Titel :
Electronics, Circuits, and Systems, 1996. ICECS '96., Proceedings of the Third IEEE International Conference on
Conference_Location :
Rodos
Print_ISBN :
0-7803-3650-X
DOI :
10.1109/ICECS.1996.584607
