Title :
A 56–67 GHz low-noise amplifier with 5.1-dB NF and 2.5-kV HBM ESD protection in 65-nm CMOS
Author :
Ming-Hsien Tsai ; Hsieh-Hung Hsieh ; Chun-Yu Lin ; Li-Wei Chu ; Hsu, Shawn S. H. ; Jun-De Jin ; Tzu-Jin Yeh ; Chewn-Pu Jou ; Fu-Lung Hsueh ; Ming-Dou Ker
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
Abstract :
This paper presents a V-band low-noise amplifier with high RF performance and ESD robustness. An inductor-triggered silicon-controlled rectifier (SCR) assisted with both a PMOS and an inductor is proposed to enhance the ESD robustness and minimize the impact of the ESD protection block on the millimeter-wave LNA. The initial-on PMOS improves the turn-on speed and the inductor resonates with the parasitic capacitance, respectively. Also, a 3-stage wideband V-band LNA is designed by using the gate inductor in the common-gate stage of the cascode topology as gain peaking to compensate the roll-off at high frequencies for bandwidth extension. The measured results demonstrate a 2.5-kV HBM ESD protection level with a minimum noise figure (NF) of 5.1 dB and a peak gain of 22 dB, also a 3-dB bandwidth of 56-67 GHz can be achieved under a power consumption of only 23 mW.
Keywords :
CMOS integrated circuits; MOS integrated circuits; capacitance; electrostatic discharge; inductors; low noise amplifiers; millimetre wave amplifiers; thyristors; wideband amplifiers; CMOS; HBM ESD protection; PMOS; bandwidth 56 GHz to 67 GHz; cascade topology; common gate stage; electrostatic discharge; frequency 56 GHz to 67 GHz; gain 22 dB; gate inductor; inductor triggered SCR; low noise amplifier; millimeter wave LNA; noise figure 5.1 dB; parasitic capacitance; power 23 mW; silicon controlled rectifier; size 65 nm; voltage 2.5 kV; wideband V-band LNA; CMOS integrated circuits; Clamps; Electrostatic discharges; Inductors; Noise measurement; Radio frequency; Thyristors; CMOS; electrostatic discharge (ESD); low-noise amplifier (LNA); millimeter wave (mm-Wave);
Conference_Titel :
Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4577-1330-9
Electronic_ISBN :
978-1-4577-1331-6
DOI :
10.1109/APMC.2012.6421722