• DocumentCode
    3097730
  • Title

    Temperature dependent linear HEMT model extracted with multi-temperature optimization

  • Author

    Yu Zhu ; Karalkar, Sagar ; Prasad, K. ; Cejun Wei ; Mason, Jennifer ; Bartle, Dylan

  • Author_Institution
    Skyworks Solutions Inc., Woburn, MA, USA
  • fYear
    2012
  • fDate
    4-7 Dec. 2012
  • Firstpage
    756
  • Lastpage
    758
  • Abstract
    Temperature dependent model is conventionally developed with 1) individual linear model extraction at each temperature and 2) temperature dependence extraction for each model parameter. A novel approach based on a multi-temperature optimization is proposed in this study. The new approach is faster and more accurate since the linear models at different temperatures are extracted simultaneously and inter-relatedly. It has been found, based on the model extracted, that there is a specific gate-source voltage of Vgs0, where the transconductance (Gm) keeps constant versus temperature. Gm increases (decreases) with temperature for Vgs<;Vgs0 (Vgs>;Vgs0). With increasing temperature, a substantial decrease in extrinsic inductance is also observed. Our findings are believed to be useful for designing HEMT amplifiers with less temperature dependence.
  • Keywords
    amplifiers; circuit simulation; high electron mobility transistors; inductance; optimisation; semiconductor device models; HEMT amplifiers; extrinsic inductance; gate-source voltage; multitemperature optimization; specific gate-source voltage; temperature dependent linear HEMT model extraction; transconductance; Fitting; HEMTs; Integrated circuit modeling; Optimization; Scattering parameters; Temperature dependence; Temperature measurement; Amplifiers; HEMTs; circuit simulation; parameter extraction; semiconductor device model; temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-4577-1330-9
  • Electronic_ISBN
    978-1-4577-1331-6
  • Type

    conf

  • DOI
    10.1109/APMC.2012.6421725
  • Filename
    6421725