A diagnostic setup for measurement of time-resolved electron beam distributions in high-power O-type devices

Author

Arkhipov, A.V. ; Dvoretskaja, N.V. ; Sominski, G.G.

Author_Institution

St. Petersburg State Tech. Univ., Russia

fYear

1999

fDate

36373

Firstpage

237

Lastpage

240

Abstract

Characteristics of a new all-in-one setup for experimental determination of electron beam parameters of high-power microwave O-type devices are given. The measurements were made in the collector part of the device, where the electron beam expanded in the absence of external electric or magnetic fields after interaction with the rf structure. The analyzing section was mounted to the microwave tube instead of the collector unit to measure spatial, angular and energy distributions of the electron beam

Keywords

electron beams; electron tube testing; microwave tubes; particle beam diagnostics; angular distribution; collector part; diagnostic setup; electron beam parameters; energy distribution; high-power microwave O-type devices; microwave tube; spatial distribution; time-resolved electron beam distribution measurement; Current density; Electrodes; Electromagnetic heating; Electron beams; Gyrotrons; Magnetic analysis; Magnetic field measurement; Microwave devices; Plasma devices; Probes;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics and Radiophysics of Ultra-High Frequencies, 1999. International University Conference Proceedings

Conference_Location

St Petersburg

Print_ISBN

5-7422-0083-8

Type

conf

DOI

10.1109/UHF.1999.787925

Filename

787925