Title :
Simulation comparison of reset operation for mushroom phase change memory cells with different access device
Author :
Faraclas, Azer ; Williams, Nicholas ; Gokirmak, Ali ; Silva, Helena
Author_Institution :
Electr. & Comput. Eng., Univ. of Connecticut, Storrs, CT, USA
Abstract :
Phase change memory (PCM) is considered to be a promising candidate for high density, fast and non-volatile memory technologies. PCM devices are resistive memory elements where the crystalline (set) and amorphous (reset) states typically have ~102-104 times difference in resistance values. The transitions between these states are achieved through localized self-heating with large current densities. Scaling device dimensions improves packing density and speed and results in reduced peak current, power and total energy required for switching [1].
Keywords :
current density; phase change memories; PCM devices; access device; amorphous state; crystalline state; current density; high-density memory technology; localized self-heating; mushroom phase change memory cells; nonvolatile memory technology; packing density; reset operation; resistive memory elements; scaling device dimensions; Conductivity; FETs; Heating; Phase change materials; Resistors; Thermal conductivity; Tin;
Conference_Titel :
Semiconductor Device Research Symposium (ISDRS), 2011 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4577-1755-0
DOI :
10.1109/ISDRS.2011.6135190