• DocumentCode
    3098744
  • Title

    A physics of failure based qualification process for flexible display interconnect materials

  • Author

    Martin, Thomas ; Christou, Aris

  • Author_Institution
    L-3 Display Syst., Univ. of Maryland, College Park, MD, USA
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The next paradigm shift in display technology involves making them flexible, bringing with it many challenges with respect to product reliability. To compound the problem, industry is continuously introducing novel materials and experimenting with device geometries to improve flexibility and optical performance. The changing landscape, makes it is imperative to have a qualification method that allows for a rapid assessment of design changes on reliability from a myriad of inter-related conditions. This investigation involves the development of a qualification process for interconnects used in flexible displays. It is the intention of this work to allow for a foundation for future research in this area.
  • Keywords
    failure analysis; flexible displays; optical interconnections; reliability; device geometry; display technology; failure based qualification process; flexible display interconnect material; interrelated condition; optical performance; product reliability; qualification process; Finite element methods; Indium tin oxide; Integrated circuit interconnections; Qualifications; Resistance; Stress; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium (ISDRS), 2011 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4577-1755-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2011.6135213
  • Filename
    6135213