• DocumentCode
    3098792
  • Title

    Simulation and effects of phase signal leakage in an improved Kahn based modulator for a high efficiency power amplifier

  • Author

    Sung Jun Lee ; Chang Wahn Yu ; Jae Ho Jung ; Kwang Chun Lee

  • Author_Institution
    Electron. & Telecommun. Res. Inst. (ETRI), Daejeon, South Korea
  • fYear
    2012
  • fDate
    4-7 Dec. 2012
  • Firstpage
    935
  • Lastpage
    937
  • Abstract
    This paper presents a simulation related to phase signal leakage in an improved Kahn based modulator for a high efficiency power amplifier. It contains a mathematical modeling of a leaked phase signal, an EVM simulation versus leakage, and a validation of the simulation method through comparison with measurement results. These are done using a LTE signal which has a bandwidth of 10 MHz, a PAPR of 9.9 dB, and a carrier frequency of 2.6 GHz for a modulator with a 3-level LPDSM. The difference between simulated and measured percent EVM is less than 0.2 %p. It is also shown that a leakage value L can be estimated from characteristics of a mixer and a LPDSM. And effects of phase signal leakage on efficiency of a power amplifier are discussed.
  • Keywords
    Long Term Evolution; delta-sigma modulation; low-pass filters; modulators; power amplifiers; 3-level LPDSM; EVM simulation; Kahn based modulator; LTE signal; PAPR; bandwidth 10 MHz; carrier frequency; frequency 2.6 GHz; high efficiency power amplifier; leakage value; leaked phase signal; low-pass delta sigma modulator; mathematical modeling; mobile communication; Microwave amplifiers; Microwave circuits; Microwave communication; Microwave integrated circuits; Mixers; Modulation; Power amplifiers; Low-pass delta sigma modulator; improved Kahn based modulator; mobile communication; power amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2012 Asia-Pacific
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-4577-1330-9
  • Electronic_ISBN
    978-1-4577-1331-6
  • Type

    conf

  • DOI
    10.1109/APMC.2012.6421783
  • Filename
    6421783