DocumentCode
3099007
Title
Functional testing of modern microprocessors
Author
Verhallen, Th J W ; van de Goor, A.J.
Author_Institution
Dept. of Electr. Eng., Delft Univ. of Technol., Netherlands
fYear
1992
fDate
16-19 Mar 1992
Firstpage
350
Lastpage
354
Abstract
In the early 1980s, a method was developed for functional testing of microprocessors. Modern microprocessors have a functionality, such as on-chip caches, which is not covered by that model. This paper extends that functional model and proposes fault models, together with tests for such modern microprocessors. The proposed concepts and algorithms have been applied to the Intel i860 microprocessor chip
Keywords
buffer storage; failure analysis; integrated circuit testing; microprocessor chips; Intel i860 microprocessor chip; fault models; functional testing; on-chip caches; Automatic testing; Built-in self-test; Hardware; Logic testing; Memory management; Microprocessors; Modems; Performance evaluation; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1992. Proceedings., [3rd] European Conference on
Conference_Location
Brussels
Print_ISBN
0-8186-2645-3
Type
conf
DOI
10.1109/EDAC.1992.205953
Filename
205953
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