• DocumentCode
    3099041
  • Title

    Full three-dimensional motion characterization of a gimballed electrostatic microactuator

  • Author

    Rembe, Christian ; Muller, Lilac ; Muller, Richard S. ; Howe, Roger T.

  • Author_Institution
    Berkeley Sensor & Acuator Center, California Univ., Berkeley, CA, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    91
  • Lastpage
    98
  • Abstract
    Advanced testing methods for the dynamics of microdevices are necessary to develop reliable marketable microelectromechanical systems (MEMS). The main purpose for MEMS testing is to provide feedback to the design-and-simulation process in an engineering development effort. This feedback should include device behavior, system parameters, and material properties. An essential part of more effective microdevice development is high-speed visualization of the dynamics of MEMS structures. We have developed and employed a full three-dimensional-motion-characterization system for MEMS to observe the response of a gimballed microactuator, a multi-degree-of-freedom microdevice
  • Keywords
    design engineering; electronic design automation; electrostatic actuators; motion estimation; semiconductor device models; semiconductor device testing; 3D motion characterization; 3D-motion-characterization system; MEMS; MEMS structure dynamics; MEMS testing; design; device behavior; engineering development; gimballed electrostatic microactuator; gimballed microactuator; high-speed visualization; material properties; microdevice development; microdevice dynamics; multi-degree-of-freedom microdevice; reliable microelectromechanical systems; simulation; system parameters; testing methods; Design engineering; Feedback; Material properties; Microactuators; Microelectromechanical systems; Micromechanical devices; Process design; Reliability engineering; System testing; Visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-6587-9
  • Type

    conf

  • DOI
    10.1109/RELPHY.2001.922887
  • Filename
    922887