DocumentCode :
3099054
Title :
A synthesis for testability technique for PLA-based finite state machines
Author :
Chakradhar, Srimat T. ; Kanjilal, Suman ; Agrawal, Vishwani D.
Author_Institution :
C&C Res. Labs., NEC, Princeton, NJ, USA
fYear :
1992
fDate :
16-19 Mar 1992
Firstpage :
361
Lastpage :
365
Abstract :
Proposes a method of testable synthesis in which a test function is incorporated into the state diagram of the object machine. The authors constrain logic minimization such that a fault has predictable effect on the composite machine (object machine embedded with the test function). This allows effective use of the test function, even when both object and test machines are faulty. A valid test sequence for a crosspoint fault is obtained by augmenting the combinational test with pre-designed O(log2 n) initialization and propagation sequences. Experimental results on the Synthesis benchmark set are given
Keywords :
computational complexity; design for testability; finite state machines; integrated circuit testing; logic CAD; logic arrays; minimisation of switching nets; PLA-based finite state machines; Synthesis benchmark set; combinational test; crosspoint fault; faulty machines; initialization; logic minimization; programmable logic array; propagation sequences; state diagram; synthesis for testability technique; test function; valid test sequence; Automata; Benchmark testing; Encoding; Laboratories; Logic testing; Minimization; National electric code; Predictive models; Programmable logic arrays; Proposals;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation, 1992. Proceedings., [3rd] European Conference on
Conference_Location :
Brussels
Print_ISBN :
0-8186-2645-3
Type :
conf
DOI :
10.1109/EDAC.1992.205955
Filename :
205955
Link To Document :
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