• DocumentCode
    3099176
  • Title

    Variance and bias computation for enhanced system identification

  • Author

    Bergmann, Martin ; Longman, Richard W. ; Juang, Jer-Nan

  • Author_Institution
    Columbia Univ., New York, NY, USA
  • fYear
    1989
  • fDate
    13-15 Dec 1989
  • Firstpage
    155
  • Abstract
    A study is made of the use of a series of variance and bias confidence criteria recently developed for the eigensystem realization algorithm (ERA) identification technique. The criteria are shown to be very effective not only for indicating the accuracy of the identification results, especially in terms of confidence intervals, but also for helping the ERA user to obtain better results. They help determine the best sample interval, the true system order, how much data to use and whether to introduce gaps in the data used, what dimension Hankel matrix to use, and how to limit the bias or correct for bias in the estimates
  • Keywords
    eigenvalues and eigenfunctions; identification; Hankel matrix; bias; confidence intervals; eigensystem; system identification; variance; Additive noise; Algorithm design and analysis; Analysis of variance; Current measurement; Kalman filters; Monte Carlo methods; NASA; Noise measurement; System identification; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1989., Proceedings of the 28th IEEE Conference on
  • Conference_Location
    Tampa, FL
  • Type

    conf

  • DOI
    10.1109/CDC.1989.70094
  • Filename
    70094