DocumentCode :
3099266
Title :
Extraction of dielectric constant based on S-parameter inversion method
Author :
Yang Ling-ling ; Sun Ling ; Shi Quan ; Sun Hai-yan
Author_Institution :
Jiangsu Key Lab. of ASIC Design, Nantong Univ., Nantong, China
Volume :
3
fYear :
2011
fDate :
11-13 March 2011
Firstpage :
353
Lastpage :
356
Abstract :
In this paper, a new extraction method for the dielectric constant of PCB material is proposed, which is based on S-parameter inversion method. The calculation process is detailed and an application example is given. According to the simulated S-parameters, while with the proposed method, the applicable frequency ranges of a set of published expressions for microstrip lines are obtained. With the calculated results, the accuracy of dielectric constants, which are obtained from the published expressions, is analyzed. The work is helpful to provide reference to calculate the characteristic impedance by using suitable expressions at different frequency.
Keywords :
S-parameters; electric impedance; microstrip lines; permittivity; printed circuits; PCB material; S-parameter inversion; characteristic impedance; dielectric constant; microstrip lines; Dielectric constant; Impedance; Materials; Microstrip; Microwave circuits; Scattering parameters; Microstrip line; S-Parameter; characteristic impedance; dielectric constant; inversion method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Research and Development (ICCRD), 2011 3rd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-61284-839-6
Type :
conf
DOI :
10.1109/ICCRD.2011.5764212
Filename :
5764212
Link To Document :
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